Thomas Walther on Muck Rack

Thomas Walther

Darmstadt, Germany
As seen in: Nature, Wiley Online Library, Bandcamp Daily, Frontiers, MDPI, The European Heart Journal, The Lancet, NDR (Germany), nordbayern.de, JoVE- Journal of Visualized Experiments and
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Articles

Rådmann, hvorfor skjules Statsforvalterens kritikk?

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By Christer Bjellås, Thomas Walther, Tommy Wårøy, Alf Gunnar Svensson
| Fædrelandsvennen
Lindesnes kommune har selv vedtatt prinsipper om åpenhet, innsyn, meroffentlighet og tillit. Lindesnes kommune får kritikk for å skjule Statsforvalterens dokumenter om saksbehandlingsfeil i Buøya-saken. Kommunen har vedtatt prinsipper om åpenhet, men unnlot offentliggjøring med henvisning til offentleglova § 24 andre ledd. Offentleglova brukes vanligvis for å beskytte sensitive dokumenter, men kritikerne krever svar om hemmeligholdet er berettiget.
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Tillit forutsetter rom for å stille spørsmål!

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By Christer Bjellås, Thomas Walther, Tommy Wårøy, Alf Gunnar Svenson
| Fædrelandsvennen
Det er et grunnleggende premiss for at samspillet mellom innbyggere, folkevalgte og administrasjon skal fungere. Nettopp derfor er det også avgjørende å være ærlig om hva som skjer når tilliten svekkes og hva som skal til for å bygge den opp igjen. Når mange innbyggere reagerer, skjer det sjelden uten grunn. Reaksjonene oppstår ofte etter at offentlige dokumenter er lest, saksbehandling er fulgt over tid og vedtak er sett i praksis.
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Comparison of different X‐ray‐based scanning electron microscopy methods to detect sub‐nanometre ultra‐thin InAs layers deposited on top of GaAs

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By Thomas Walther, Bruker Nano Analytics, Stuart Creasey-Gray, Stephan Boehm
| Wiley Online Library
1 INTRODUCTION Surface analysis of thin films can be achieved by different techniques where those that yield ultra-low (parts-per-million, ppm) sensitivity often have low penetration (e.g. secondary ion mass spectroscopy, SIMS) or low escape depths (e.g. Auger electron spectroscopy, AES) and so typically need to be combined with destructive depth profiling1, 2 while those with high penetration (e.g. proton-induced X-ray generation, medium energy ion scattering)3 are often hard to quantify.
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