Yeon Ui Lee

1 Introduction Super-resolution fluorescence microscopy, i.e., nanoscopy, has been widely used for examining the nanoscale structure and biological dynamics of living cells and tissues.[1] It overcomes the classical resolution barrier in optical microscopy—i.e. 200–300 nm in the lateral plane and 500–800 nm along the axial direction[2]—by exploiting different physical mechanisms.[3] To improve the lateral resolution most of the state-of-the-art super-resolution nanoscopies rely on modifying...

The traditional law of refraction defines the incidence plane as the plane including the incident beam wavevector and the surface normal vector at the interface of two different optical media. The optical spin Hall effect (OSHE) refers to the spin-dependent transverse shift of the refracted beam perpendicular to the incidence plane. In this Letter, we demonstrate that OSHE in out-of-plane refraction can be detected and visualized in the far-field, even at small and normal incidence angles.

Abstract Fluorescence super-resolution microscopy has, over the last two decades, been extensively developed to access deep-subwavelength nanoscales optically. Label-free super-resolution technologies however have only achieved a slight improvement compared to the diffraction limit.