Yu Dian Lim

With the continuous development of integrated silicon photonics (SiPh) gratings, more and more studies have used them for optical addressing of trapped ions. However, the ion trapping height decreases as the grating size decreases and eventually falls into the near-field range. To obtain a high-precision 3D electric field, the traditional finite-difference time-domain (FDTD) simulation consumes a lot of time and computer memory.

Introduction Click to copy section linkSection link copied! Plasmonic photocatalysts have shown great promise for utilizing light to drive chemical reactions with high selectivity and at mild conditions. (1−3) These factors, among others, may make them more economically and environmentally suitable than thermal catalysts for some technologies. The antenna-reactor architecture, particularly alloys, allows for fine-tuning the system properties for high performance.

When observing chip-to-free-space light beams from silicon photonics (SiPh) to free space, manual adjustment of camera lens is often required to obtain a focused image of the light beams. In this Letter, we demonstrated an auto-focusing system based on the you-only-look-once (YOLO) model. The trained YOLO model exhibits high classification accuracy of 99.7% and high confidence level of >0.95 when detecting light beams from SiPh gratings.