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Yuhyeon Oh

As seen in: ACS Publications
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Articles

Direct Mapping of Crystallization-Induced Trap-State Modulation and Its Impact on Local Carrier Mobilities in Indium Oxide Thin-Film Transistors

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By Yuhyeon Oh, Jeong Eun Oh, Seunghyo Park
| ACS Publications
Abstract Click to copy section linkSection link copied! Crystalline oxide semiconductors are promising back-end-of-line (BEOL)-compatible channel materials for AI hardware, yet their nanoscale trap physics remains unclear. Here, we directly mapped and quantified mobility (μ), trap density (Neff), and trap depth in amorphous/nanocrystalline (a/n-) and polycrystalline (p-) In2O3 films using scanning noise microscopy with finite-element analysis.
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Nanoscale Mapping of Charge-Trap-Induced Localized Bandgap Variations in Perovskite Solar Cell Structures via Wavelength-Dependent Noise Microscopy

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By Byungwoo Park, Mingyu Jung, Alan Jiwan Yun, Yuhyeon Oh
| dx.doi.org
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