Majeed Ahmad on Muck Rack

Majeed Ahmad

Verified
Lahore
As seen in: EDN: Voice of the Engineer, Planet Analog, IEEE Spectrum, EETimes Japan, IT Media, EE Times, Electronic Design, EEWorld Online, All About Circuits, Greater Kashmir, Embedded, EE Times Asia and
Semiconductor industry writer, blogger, technology historian, and author of 6 books on mobile and IoT. Bylines on @eetimes, @EDNcom and @ElectronicProd.
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Articles

Edge AI deployment made easy for system integrators

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By Majeed Ahmad 
| EDN: Voice of the Engineer
In 2025, Innodisk launched the “AI beyond the edge” initiative at a forum that also hosted Intel, Nvidia, and Qualcomm, which shared details of their latest developments in edge AI. But what does “AI beyond the edge” really mean? Don Yu, special assistant to the GM at Innodisk, said that “AI beyond the edge” is about enabling systems that operate autonomously, remain connected, and scale across real-world environments. He also mentioned two complementary domains as part of this initiative.
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ニコン、半導体露光装置で巻き返しなるか ： ArF液浸スキャナーを安価に提供 （1/2 ページ）

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By Majeed Ahmad 
| EETimes Japan
ニコンが、同社製リソグラフィ装置の価格を引き下げる計画を発表し、注目を集めている。複数の部品を自社製造することで、全体的なコストを削減するという。2026年4月に同社の代表取締役 兼 社長執行役員 CEOに就任した大村泰弘氏は、日経新聞の取材に応じ、「現在、米国やアジアの大手半導体メーカー数社とArF露光装置の供給について話し合いを進めており、一部の案件が発注につながりそうだ」と述べている（参考）。 同社は2028年までに、新しいレンズとウエハーステージを備えた新型のArF液浸プラットフォームを発表する予定で、ASML製リソグラフィ装置との互換性も構築していくという。これは非常に重要な点である。というのは、もちろん価格も重要だが、その一方でファブのエンジニアが、ニコン製装置で構築したレイヤーを、ASML製装置でパターニングを行ったレイヤーに再調整しようとする際に、問題が生じるためだ。...
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The RF-ready GaN-on-silicon with lower parasitic losses

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By Majeed Ahmad 
| EDN: Voice of the Engineer
A new technology addresses a key performance barrier limiting the use of GaN-on-silicon semiconductors in mainstream RF applications. According to Scott Bibaud, president and CEO of Atomera, this will change the economics of GaN in RF by unlocking breakthrough RF performance on low-cost silicon substrates.
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